Failure Analysis
Our comprehensive testing and failure analysis capabilities can help you diagnose both design and manufacturing problems.
In addition to being your EMS provider, OSE can leverage the capability of our Semiconductor Group to become your total testing and analysis laboratory. We can analyze finished devices, assemblies or even individual components and IC's. Whether your problem stems from components, process or design, trust us to find the root cause and better your product.
Laboratory Services
| Scanning acoustic microscope (SAM) | Transducer: 10MHz / 15MHz / 20MHz / 30MHz / 50MHz / 100MHz / 230MHz |
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| Scanning electron microscope (SEM) | A/V: 5-20kV; Magification: 20-100,000×; Resolution: 2.5nm |
| Energy disperse X-ray (EDX) | Z>4, detection depth: 5-10µm |
| Curve tracer | O/S testing; multi-pins (625 pins) |
| Probe station | 4 manipulator, hot chuck |
| High/low power optical microscope | Eyepiece: 10×; objective: 5-100× |
| Grinding/polishing machine | Variable speed: 40-500rpm |
| Precision sectioning saw | Various blade type, max speed 4000rpm |
| X-ray | Real time observation |
| Liquid crystal thermal analysis kit | Three types of L.C. |